R&S^®ZVA Vector Network Analyzers

Optimize test and configuration time to increase throughput

Wide IF bandwidth and wide dynamic range for fast and accurate measurements

The R&S^®ZVA sets new standards in measurement speed: Its large IF bandwidth of 1 MHz (optionally: 5/10 MHz) and fast synthesizers combine to yield short measurement times and thus high throughput in manual adjustments and automated production sequences. The measurement time per test point is less than 3.5 µs in the CW mode; a frequency sweep over 200 test points takes less than 5 ms.

Due to the analyzer's wide dynamic range and low phase noise, this speed advantage does not compromise measurement accuracy. With more than 100 independent channels and traces configurable on the R&S^®ZVA, you can perform comprehensive functional tests on complex components in a minimum of time. The time-consuming loading of new instrument setups is no longer necessary.

Wide dynamic range

Minimize calibration effort and time

R&S® ZV-Z5x automatic calibration units

Cut calibration time to a minimum with automatic calibration units:

• Automatic detection of connected unit and connected port: no configuration required.
• Wide temperature range means almost zero warm-up time.

Manual calibration

• Rohde & Schwarz network analyzers offer the highest number of calibration techniques. Your test setup may need calibration in fixtures, on wafers, on a PCB, with waveguides, or at wire ends. Select the calibration technique that supports the calibration standards you have available.
• Clear-cut dialog with all calibration steps for error-free calibration.
• A faulty connection during calibration merely requires that the corresponding calibration step be repeated, i.e. you do not have to perform a completely new calibration.
• Save effort in the case of multiport recalibration: After replacement of a test set component (e.g. a faulty cable), only the paths concerned have to be recalibrated.
• Avoid recalibration: Use existing calibrations for further measurement channels and setups.

Parallel measurements – up to four times faster

The generator concept of the R&S^®ZVA allows each test port to be operated as a source and a receiver at the same time. Test ports can thus be organized in groups. The measurements carried out on the individual test port groups are synchronized with each other. Several DUTs, or several paths of one DUT, can thus be measured in parallel; the measurement time corresponds to measuring just one device. Therefore, the measurement time will not double when measuring two two-port DUTs in parallel and not quadruple when measuring four one-port DUTs in parallel.

Parallel measurements

Fast switching between instrument setups

When analyzing two or more DUTs, you no longer have to load the required instrument setups from the hard disk one after the other. Once called, setups remain available in RAM − including calculated data, e.g. calibration values obtained by interpolation. You can therefore switch between setups virtually without delay, i.e. in less than 10 ms by remote control. With conventional instruments, recalling setups can take up to one second. Each setup is represented by a separate measurement window. You can switch between windows by using the mouse or pressing a key. This design feature also supports the convenient handling and clear representation of a large number of measurements and traces.

Switching between setups

Data transfer simultaneous with sweep

Since trace data is transferred via the IEC/IEEE bus or LAN at the same time measured data is being captured, data transfer time on the R&S^®ZVA is insignificant in the case of repeated measurement sequences.

Channel bits and user port – high-speed control of external devices

To speed up automatic test cycles even further, a special port for trigger I/O signals is provided on the rear panel. These signals directly synchronize external devices of a test setup or the settings of a DUT with the internal measurement sequences of the R&S^®ZVA. Instrument states such as “Ready for trigger” are available as electronic signals for the direct control of external devices. No remote control sequences are required, thus saving execution time.

Segmented sweep for optimized speed, accuracy, and dynamic range

The segmented sweep function allows you to divide a sweep into a virtually unlimited number of segments. Sweep parameters such as test point spacing, measurement bandwidth, and generator power can be defined separately for each segment and thus accurately matched to the DUT characteristic. Measurement speed and accuracy can thus be further optimized.